alitech52 Posted May 20, 2014 Share Posted May 20, 2014 Respected Sir We have on nexenta CE which have around 14 SSD Drives (Corsair Neutron GTX 480 GB ) drives attached to a supermicro system with 64 GB RAM 14 disk is configured as RAID10 in nexenta of total 3TB and this 3TB Lun is assingn to a Redhat Virtulization (Virtual Machine) as direct lun/passthrough to the virtual machine and the virtual machine is having 96GB Ram assigned to it and running ORACLE database Now about 6 month the nexenta storage performs well after this much period over storage performance get degraded/deteriorating Now our problem is the SSD Drives what we have connected to nexenta storage does not have smartmon database to check the SSD_Life_Left attribute so we have run the smart command on some drives to identified that is their any problem with the drives so we get the following below output smartctl 5.42 2011-10-20 r3458 [i386-pc-solaris2.11] (local build) Copyright © 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: Corsair Neutron GTX SSD Serial Number: 12517924000021010190 Firmware Version: M206 User Capacity: 480,103,981,056 bytes [480 GB] Sector Size: 512 bytes logical/physical Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Tue May 20 16:32:10 2014 IST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART STATUS RETURN: incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x1d) SMART execute Offline immediate. No Auto Offline data collection support. Abort Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 5) minutes. SMART Attributes Data Structure revision number: 0 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002e 166 166 006 Old_age Always - 0 5 Reallocated_Sector_Ct 0x0032 100 100 036 Old_age Always - 1 9 Power_On_Hours 0x0032 088 088 000 Old_age Always - 10869 12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 36 171 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 4 172 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 0 181 Program_Fail_Cnt_Total 0x0032 100 100 000 Old_age Always - 4 182 Erase_Fail_Count_Total 0x0032 253 253 000 Old_age Always - 0 194 Temperature_Celsius 0x0002 028 000 000 Old_age Always - 28 (Min/Max 22/34) 201 Soft_Read_Error_Rate 0x0032 100 100 000 Old_age Always - 0 204 Soft_ECC_Correction 0x0032 100 100 000 Old_age Always - 0 231 Temperature_Celsius 0x0032 092 092 000 Old_age Always - 9 234 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 76126 241 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 95735 242 Total_LBAs_Read 0x0032 100 100 000 Old_age Always - 31158 250 Read_Error_Retry_Rate 0x0032 100 100 000 Old_age Always - 1202 SMART Error Log Version: 1 ATA Error Count: 15 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 15 occurred at disk power-on lifetime: 10869 hours (452 days + 21 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 ff 00 4f c2 e0 Error: IDNF Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d5 01 06 4f c2 00 00 31d+07:42:11.824 SMART READ LOG b0 d5 01 01 4f c2 00 00 31d+07:42:11.824 SMART READ LOG b0 da 00 00 4f c2 00 00 31d+07:42:11.824 SMART RETURN STATUS b0 d1 01 01 4f c2 00 00 31d+07:42:11.824 SMART READ ATTRIBUTE THRESHOLDS [OBS-4] b0 d0 01 00 4f c2 00 00 31d+07:42:11.814 SMART READ DATA Error 14 occurred at disk power-on lifetime: 10868 hours (452 days + 20 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 ff 00 4f c2 e0 Error: IDNF Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d5 01 06 4f c2 00 00 31d+07:27:29.834 SMART READ LOG b0 d5 01 01 4f c2 00 00 31d+07:27:29.824 SMART READ LOG b0 da 00 00 4f c2 00 00 31d+07:27:29.824 SMART RETURN STATUS b0 d1 01 01 4f c2 00 00 31d+07:27:29.824 SMART READ ATTRIBUTE THRESHOLDS [OBS-4] b0 d0 01 00 4f c2 00 00 31d+07:27:29.824 SMART READ DATA Error 13 occurred at disk power-on lifetime: 10868 hours (452 days + 20 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 ff 00 4f c2 e0 Error: IDNF Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d5 01 06 4f c2 00 00 31d+07:26:46.114 SMART READ LOG b0 d5 01 01 4f c2 00 00 31d+07:26:46.114 SMART READ LOG b0 da 00 00 4f c2 00 00 31d+07:26:46.114 SMART RETURN STATUS b0 d1 01 01 4f c2 00 00 31d+07:26:46.114 SMART READ ATTRIBUTE THRESHOLDS [OBS-4] b0 d0 01 00 4f c2 00 00 31d+07:26:46.114 SMART READ DATA Error 12 occurred at disk power-on lifetime: 10868 hours (452 days + 20 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 ff 00 4f c2 e0 Error: IDNF Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d5 01 06 4f c2 00 00 31d+07:25:17.604 SMART READ LOG b0 d5 01 01 4f c2 00 00 31d+07:25:17.604 SMART READ LOG b0 da 00 00 4f c2 00 00 31d+07:25:17.604 SMART RETURN STATUS b0 d1 01 01 4f c2 00 00 31d+07:25:17.604 SMART READ ATTRIBUTE THRESHOLDS [OBS-4] b0 d0 01 00 4f c2 00 00 31d+07:25:17.594 SMART READ DATA Error 11 occurred at disk power-on lifetime: 10868 hours (452 days + 20 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 ff 00 4f c2 e0 Error: IDNF Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d5 01 06 4f c2 00 00 31d+07:23:07.424 SMART READ LOG b0 d5 01 01 4f c2 00 00 31d+07:23:07.424 SMART READ LOG b0 da 00 00 4f c2 00 00 31d+07:23:07.414 SMART RETURN STATUS b0 d1 01 01 4f c2 00 00 31d+07:23:07.414 SMART READ ATTRIBUTE THRESHOLDS [OBS-4] b0 d0 01 00 4f c2 00 00 31d+07:23:07.404 SMART READ DATA SMART Self-test log structure revision number 0 Warning: ATA Specification requires self-test log structure revision number = 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Device does not support Selective Self Tests/Logging ########################################### Now the following below attribute 250 Read_Error_Retry_Rate 0x0032 100 100 000 Old_age Always - 1202 show that is has 1202 error while reading so i need to know whether is their any problem with the ssd drives Please give any suggestion by seeing the above output Regards, Link to comment Share on other sites More sharing options...
glugglug Posted May 22, 2014 Share Posted May 22, 2014 A lot of RAID controllers don't support TRIM. That will cause gradual degradation as each logical cluster gets written once (eventually plateauing at a minimum performance once every block has been written at least once). This will also cause wear to be a lot quicker. Link to comment Share on other sites More sharing options...
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